NSOM-based characterization method applicable to optical channel waveguide with a solid-state cladding

Title
NSOM-based characterization method applicable to optical channel waveguide with a solid-state cladding
Authors
Ji, W.; Kim, D.; Kim, H.J.; O, B.H.; Park, S.G.; Lee, E.H.; Lee, S.G.
Keywords
electric field measurement, microscopy, optical waveguides
Issue Date
2005-04
Publisher
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
Abstract
A new characterization method employing near-field scanning optical microscope (NSOM) is proposed to measure the propagation characteristics of an optical channel waveguide having a solid-state cladding. For the measurement, the cladding material is replaced with the liquid having the same refractive index as that of the removed cladding. Replacing the solid-state cladding with the liquid enables the NSOM probe to reach the core-cladding interface without changing the boundary condition at the interface. The height of the probe immersed into the viscous liquid is done with the information from the surface profile of the naked core. The measured propagation characteristic shows a good agreement with the simulation result.
URI
http://dspace.inha.ac.kr/handle/10505/1873
Appears in Collections:
College of Engineering(공과대학) > Information and Communication Engineering (정보통신공학) > Journal Papers, Reports(정보통신공학 논문, 보고서)
Files in This Item:
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