X-ray photoelectron spectroscopy study of magnetic tunnel junctions

Title
X-ray photoelectron spectroscopy study of magnetic tunnel junctions
Authors
Lee, B.C.
Keywords
300 DEGREES-C, THERMAL-STABILITY, TEMPERATURE-DEPENDENCE, MAGNETORESISTANCE, OXIDATION
Issue Date
2005-01
Publisher
AMER INST PHYSICS
Abstract
Magnetic tunnel junction ( MTJ) structures were investigated by x-ray photoelectron spectroscopy. The Al layer was overoxidized and the samples were treated by rapid thermal annealing. It was found that the Mn atoms in the exchange-bias layer diffused into the magnetic layer, but did not reach the oxide barrier. Although slightly higher oxygen concentration was observed at the interface between the magnetic layer and the oxide barrier, strong evidence of the oxidized magnetic-layer interface was not found. Our result is consistent with the high tunneling magnetoresistance of MTJs at room temperature.
URI
http://dspace.inha.ac.kr/handle/10505/1678
ISSN
0021-8979
Appears in Collections:
College of Natural Science(자연과학대학) > Physics (물리학) > Journal Papers, Peports(물리학 학술논문, 보고서)
Files in This Item:
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