Comment on "Characterization of As-doped, p-type ZnO by x-ray absorption near-edge structure spectroscopy: Theory" [Appl. Phys. Lett. 89, 222113 (2006)]

Title
Comment on "Characterization of As-doped, p-type ZnO by x-ray absorption near-edge structure spectroscopy: Theory" [Appl. Phys. Lett. 89, 222113 (2006)]
Authors
Kim, Sang Sub; Vaithianathan, Veeramuthu
Keywords
p-type ZnO, x-ray absorption
Issue Date
2008-06
Publisher
American Institute of Physics
Description
Comment on “Characterization of As-doped, p-type ZnO by x-ray absorption near-edge structure spectroscopy: Theory”
URI
http://dspace.inha.ac.kr/handle/10505/1532
ISSN
0003-6951
Appears in Collections:
College of Engineering(공과대학) > Materials Science & Engineering (신소재공학) > Journal Papers, Reports(신소재공학 논문, 보고서)
Files in This Item:
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