The effect of moisture on the photon-enhanced negative bias thermal instability in Ga-In-Zn-O thin film transistors

Title
The effect of moisture on the photon-enhanced negative bias thermal instability in Ga-In-Zn-O thin film transistors
Authors
Choi, Rino; Jeong, Jae Kyeong
Keywords
Ga-In-Zn-0, thin film transistors, moisture
Issue Date
2009-12
Publisher
American Institute of Physics
Abstract
We investigated the impact of photon irradiation on the stability of gallium-indium-zinc oxide (GIZO) thin film transistors. The application of light on the negative bias temperature stress NBTS accelerated the negative displacement of the threshold voltage Vth. This phenomenon can be attributed to the trapping of the photon-induced carriers into the gate dielectric/channel interface or the gate dielectric bulk. Interestingly, the negative Vth shift under photon-enhanced NBTS condition worsened in relatively humid environments. It is suggested that moisture is a significant parameter that induces the degradation of bias-stressed GIZO transistors.
URI
http://dspace.inha.ac.kr/handle/10505/1505
ISSN
0003-6951
Appears in Collections:
College of Engineering(공과대학) > Materials Science & Engineering (신소재공학) > Journal Papers, Reports(신소재공학 논문, 보고서)
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